X-ray single crystal orientation measurement
By replacing the sample holder, measurements can be taken from φ2.88mm chips to φ6 inch ingots!
We measure the crystal orientation of single crystals such as sapphire, SiC, and LTGA with respect to the cutting direction of the crystal axis. By changing the sample holder, measurements can be made from φ2.88mm chips to φ6 inch ingots. We also offer contract measurements, so please feel free to contact us. *For more details, please refer to the PDF document or feel free to contact us.
- 企業：シンコー
- 価格：Other
